Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Alton D. Romig Jr., Charles E. Lyman, Charles Fiori, Eric Lifshin

eBook, PDF

Scanning Electron Microscopy and X-Ray Microanalysis (eBook, PDF)

A Text for Biologists, Materials Scientists, and Geologists

Beschreibung

In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.

Technische Details

• Geräte: PC
• ohne Kopierschutz
• Größe: 128.82MB

Barrierefreiheit

• Text-to-Speech

Autor

Joseph Goldstein, University of Massachusetts, Amherst, MA, USA / Dale E. Newbury, National Institute of Standards and Technology, Gaithersburg, MD, USA / David C. Joy, University of Tennessee, Knoxville, TN, USA / Charles E. Lyman, Lehigh University, Bethlehem, PA, USA / Patrick Echlin, University of Cambridge, UK / Eric Lifshin, State University at Albany, NY, USA / L.C. Sawyer, Ticona LLC, Summit, NJ, USA / J.R. Michael, Sandia National Laboratories, Albuquerque, NM, USA

Produktdetails

• Verlag: Springer US
• Seitenzahl: 840
• Erscheinungstermin: 6. Dezember 2012
• Englisch
• ISBN-13: 9781461304913
• Artikelnr.: 44052883

Rezensionen

"There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written [and] well organized[.]... This is a reference text that no SEM or EPMA laboratory should be without." --Thomas J. Wilson, in Scanning, Vol. 27, No. 4, July/August 2005 "As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. The principal application and sample preparation given in this book are suitable for undergraduate students and technicians learning SEEM and EDS/WDS analyses. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists." (Microscopy and Microanalysis, 9:5 (October 2003)

From a review of the first edition:
`The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.'
Microscope Journal