Amit Mehrotra, Alberto L. Sangiovanni-Vincentelli

eBook, PDF

Noise Analysis of Radio Frequency Circuits (eBook, PDF)

Beschreibung

In this book, we concentrate on developing noise simulation techniques for RF circuits. The difference between our approach of performing noise analysis for RF circuits and the traditional techniques is that we first concentrate on the noise analysis for oscillators instead of non-oscillatory circuits. As a first step, we develop a new quantitative description of the dynamics of stable nonlinear oscillators in presence of deterministic perturbations. Unlike previous such attempts, this description is not limited to two-dimensional system of equations and does not make any assumptions about the type of nonlinearity. By considering stochastic perturbations in a stochastic differential calculus setting, we obtain a correct mathematical characterization of the noisy oscillator output. We present efficient numerical techniques both in time domain and in frequency domain for computing the phase noise of oscillators. This approach also determines the relative contribution of the device noise sources to phase noise, which is very useful for oscillator design.

Technische Details

• Geräte: PC
• ohne Kopierschutz
• Größe: 12.97MB

Barrierefreiheit

• Text-to-Speech

Produktdetails

• Verlag: Springer US
• Seitenzahl: 184
• Erscheinungstermin: 17. April 2013
• Englisch
• ISBN-13: 9781475760071
• Artikelnr.: 44063791

Rezensionen

From the reviews: "This book addresses the problem of predicting the performance of RF systems ... in the presence of noise and developing noise models at the component level, which can be used in a system-level noise-simulation technique. ... novel numerical techniques based on stochastic differential equations and models for behavior simulation have been introduced into noise analysis. The book is full of rigorous and mathematically elegant noise analysis techniques. ... The breakthrough contribution of this book aims at the challenges of RF noise analysis ... ." (Patrick B. Wu, IEEE Circuits & Devices Magazine, Vol. 21 (6), November/December, 2005)