King-Ning Tu, Yingxia Liu

eBook, PDF

Elements of Electromigration (eBook, PDF)

Electromigration in 3D IC technology

Beschreibung

In this invaluable resource for graduate students and practicing professionals, Tu and Liu provide a comprehensive account of electromigration and give a practical guide on how to manage its effects in microelectronic devices, especially newer devices that make use of 3D architectures.

Technische Details

• Geräte: PC
• mit Kopierschutz

Barrierefreiheit

• Text-to-Speech
• E-Mail des Verlags für Barrierefreiheitsfragen: [e-mail]
• Seitennummerierung folgt dem gedruckten Werk
• Kurze Alternativtexte für nicht-textuelle Inhalte vorhanden
• Navigierbarer Index mit direktem Zugriff auf Indexbegriffe
• Navigierbares Inhaltsverzeichnis für direkten Zugriff auf Text und Medien

Autor

King-Ning Tu is Professor Emeritus at UCLA and Chair Professor of Materials and Electrical Engineering of City University of Hong Kong. Professor Tu received his BSc degree from National Taiwan University, MSc degree from Brown University, and PhD degree on applied physics from Harvard University in 1960, 1964, and 1968, respectively. Professor Tu is a world leader in the science of thin films, especially in their applications in microelectronic devices, packaging, and reliability.

Dr. Yingxia Liu is an Assistant Professor at City University of Hong Kong. Dr. Liu received her Ph.D. from the Department of Materials Science and Engineering, University of California, Los Angeles in 2016 and her Bachelor's degree from the College of Chemistry and Molecular Engineering, Peking University in 2012.

Produktdetails

• Verlag: Taylor & Francis eBooks
• Seitenzahl: 142
• Erscheinungstermin: 19. Januar 2024
• Englisch
• ISBN-13: 9781003827382
• Artikelnr.: 69570266