Design, Automation, and Test in Europe (eBook, PDF)
eBook, PDF

Design, Automation, and Test in Europe (eBook, PDF)

The Most Influential Papers of 10 Years DATE

Redaktion: Lauwereins, Rudy; Madsen, Jan
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The Design, Automation and Test in Europe (DATE) conference celebrated in 2007 its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.The papers were grouped in six sections: System Level Design; Networks on Chip; Modeling, Simulation and Run-Time Management; Digital Systems ...

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