Sérgio Luiz Morelhão

eBook, PDF

Computer Simulation Tools for X-ray Analysis (eBook, PDF)

Scattering and Diffraction Methods

Beschreibung

The main goal of this book is to break down the huge barrier of difficulties faced by beginners from many fields (Engineering, Physics, Chemistry, Biology, Medicine, Material Science, etc.) in using X-rays as an analytical tool in their research. Besides fundamental concepts, MatLab routines are provided, showing how to test and implement the concepts. The major difficult in analyzing materials by X-ray techniques is that it strongly depends on simulation software. This book teaches the users on how to construct a library of routines to simulate scattering and diffraction by almost any kind of samples. It provides to a young student the knowledge that would take more than 20 years to acquire by working on X-rays and relying on the available textbooks.

In this book, fundamental concepts in applied X-ray physics are demonstrated through available computer simulation tools. Using MatLab, more than eighty routines are developed for solving the proposed exercises, most of which can be directly used in experimental data analysis. Therefore, besides X-ray physics, this book offers a practical programming course in modern high-level language, with plenty of graphic and mathematical tools.

Technische Details

• Geräte: PC
• ohne Kopierschutz
• Größe: 6.94MB

Autor

Prof. Dr. Sérgio Luiz Morelhão received his PhD in Applied Physics from University of Campinas (UNICAMP), Brazil, in 1994 (highlight: theoretical framework and applications of hybrid reflections of X-rays in semiconductor devices). Postdoc in Material Science and Engineering at Carnegie Mellon University, USA, in 1996 (highlight: X-ray topography for understanding the rule of dislocation reactions in silicon solar cells grown from dendritic seeds). Postdoc in synchrotron radiation at the Brazilian Synchrotron Laboratory in 1996/1997 (building of the 1st X-ray diffraction beam line). Faculty at University of São Paulo since 1997 (highlights: theory and experiments for solving the phase problem in X-ray crystallography; application of phase contrast X-ray imaging for studying eye cataract disease; and advanced methods for characterizing nanostructured devices. He is author of more than 50 research papers on X-rays, most of which as the leading author.

Produktdetails

• Verlag: Springer International Publishing
• Seitenzahl: 294
• Erscheinungstermin: 5. Oktober 2015
• Englisch
• ISBN-13: 9783319195544
• Artikelnr.: 43909746