Ferdinand van der Heijden, Robert P. Duin, Dick De Ridder, David M. J. Tax

eBook, PDF

Classification, Parameter Estimation and State Estimation (eBook, PDF)

An Engineering Approach Using MATLAB

Beschreibung

Classification, Parameter Estimation and State Estimation isa practical guide for data analysts and designers of measurementsystems and postgraduates students that are interested in advancedmeasurement systems using MATLAB. 'Prtools' is a powerful MATLABtoolbox for pattern recognition and is written and owned by one ofthe co-authors, B. Duin of the Delft University of Technology. After an introductory chapter, the book provides the theoreticalconstruction for classification, estimation and state estimation.The book also deals with the skills required to bring thetheoretical concepts to practical systems, and how to evaluatethese systems. Together with the many examples in the chapters, thebook is accompanied by a MATLAB toolbox for pattern recognition andclassification. The appendix provides the necessary documentationfor this toolbox as well as an overview of the most usefulfunctions from these toolboxes. With its integrated and unifiedapproach to classification, parameter estimation and stateestimation, this book is a suitable practical supplement inexisting university courses in pattern classification, optimalestimation and data analysis. * Covers all contemporary main methods for classification andestimation. * Integrated approach to classification, parameter estimation andstate estimation * Highlights the practical deployment of theoretical issues. * Provides a concise and practical approach supported by MATLABtoolbox. * Offers exercises at the end of each chapter and numerous workedout examples. * PRtools toolbox (MATLAB) and code of worked out examplesavailable from the internet * Many examples showing implementations in MATLAB * Enables students to practice their skills using a MATLABenvironment

Technische Details

• Geräte: PC
• mit Kopierschutz
• Größe: 6.6MB

Barrierefreiheit

• Text-to-Speech

Autor

F. van der Heijden, Laboratory for Measurement and Instrumentation, Faculty of Electrical Engineering, University of Twente, P.O. Box 217, 7500AE Enschede, The Netherlands

His main research area is in Measurement and Instrumentation at an academic level and covers sensors and micro measurement systems, and image based measurement systems. He has written books, many book chapters and journal articles.

R.P.W. Duin, Pattern Recognition Group, Delft University of Technology, Department of Imaging Sciences & Technology Lorentzeg 1-2628 CD Delft, The Netherlands

His research includes: theory and applications of image processing and pattern recognition, with a special interest in sensors, measurements and measurement accuracy. He also studies the development and use of tools in this area. He has written 6 books (in English and Dutch) and many journal and conference papers and chapters in books. He is a member of Advanced School for Computing and Imaging (ASCI), Dutch Pattern Recognition Society (NVPHBV), International Association for Pattern Recognition (IAPR) and IAPR Technical Committee TC1 (statistical pattern recognition).

D. de Ridder, Pattern Recognition Group, Delft University of Technology, Department of Imaging Sciences & Technology Lorentzeg 1-2628 CD Delft, The Netherlands

He mainly works on methods for mapping high-dimensional measurement sets to low-dimensional representations, suitable for subsequent regression or classification. He works closely with R Duin and has co-written many papers with him.

D.M.J. Tax, Fraunhofer FIRST.IDA, Kekul¿estr. 7, D-12489, Berlin, Germany

His main research interest is one-class classification. He was the author/co-author of many journal publications

Produktdetails

• Verlag: John Wiley & Sons
• Erscheinungstermin: 10. Juni 2005
• Englisch
• ISBN-13: 9780470090145
• Artikelnr.: 37290423