Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces (eBook, PDF)

Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces (eBook, PDF)

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This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline ß-Si3N4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF). These interfaces are of a great fundamental and technological interest because they play an important role in the microstructural evolution and mechanical properties of Si3N4 ceramics used in many high temperature and pressure applications. The main ...

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