Uncertainty estimation in Complex S-parameter measurements
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To realize the faster and accurate characterization of components, Vector Network Analyzer (VNA) system is extensively used in the microwave measurements. The knowledge to proper use of VNA system along with the calibration kits is a vital requirement for the technical staff engaged in the calibration lab, Scientists and Researchers and Post-graduate students as well. In addition, it is equally important to have reliable and repeatable measurements from VNA. This book presents an incomplex procedure to estimate the uncertainty on measured scattering (S) parameters in complex form. Features: a)...
To realize the faster and accurate characterization of components, Vector Network Analyzer (VNA) system is extensively used in the microwave measurements. The knowledge to proper use of VNA system along with the calibration kits is a vital requirement for the technical staff engaged in the calibration lab, Scientists and Researchers and Post-graduate students as well. In addition, it is equally important to have reliable and repeatable measurements from VNA. This book presents an incomplex procedure to estimate the uncertainty on measured scattering (S) parameters in complex form. Features: a) Methods to obtain the response of each uncertainty components for one-port and two-port measurements b) Three microwave passive components, coaxial step attenuator, fixed attenuator and coaxial mismatch taken as device under test for better understanding c) VNA measurements performed to assign an overall uncertainty in terms of complex and linear units d) Verification of VNA measurements through the primary and transfer standards of the attenuation and impedance parameters e) Establishment of the metrological traceability in the VNA measurements according to ISO/IEC 17025:2005.
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