Thermal Aware Testing Techniques for Digital VLSI Circuits
Arpita Dutta
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Thermal Aware Testing Techniques for Digital VLSI Circuits

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Testing is one of the most important phase of VLSI design cycle, which ensures quality and defect-free functionality of an integrated circuit. With the rapid advancement of design complexity, the power dissipation and thermal problems (higher temperature and thermal gradient) caused by localized heating became a serious concern. In order to perform testing of a large set of different possible fault conditions of an IC, power and temperature dissipation are increased at a much more higher rate than the normal mode of operation, resulting serious damage of the chip due to overheating and burning...