Narendra Devta-Prasanna

Broschiertes Buch

Testing Sequence Dependent Defects

New Methods of Applying Two-pattern Tests and Testing Sequence Dependent Defects

Beschreibung

With new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuck-at fault model. In this work we present methods of generating and applying two-pattern test sets to enable high quality and cost effective testing of sequence dependent defects such as transition delay faults, transistor stuck-open faults etc.

Autor

Narendra Devta-Prasanna, PhD; Obtained PhD from University of Iowa and bachelors from Indian Institute of Technology, Roorkee;Specializes in DFT techniques for test cost reduction and test quality improvement; Previously worked as VLSI Design Engineer at MindTree Technologies and is currently working as Staff Engineer at LSI Corporation.

Produktdetails

• Verlag: LAP Lambert Academic Publishing
• Seitenzahl: 116
• Erscheinungstermin: 21. Mai 2010
• Englisch
• Abmessung: 220mm x 150mm x 7mm
• Gewicht: 191g
• ISBN-13: 9783838312194
• ISBN-10: 3838312198
• Artikelnr.: 27140150