Broschiertes Buch

System Dependability and Analytics

Approaching System Dependability from Data, System and Analytics Perspectives

Herausgegeben: Wang, Long; Pattabiraman, Karthik; Di Martino, Catello; Athreya, Arjun; Bagchi, Saurabh

Beschreibung

This book comprises chapters authored by experts who are professors and researchers in internationally recognized universities and research institutions. The book presents the results of research and descriptions of real-world systems, services, and technologies. Reading this book, researchers, professional practitioners, and graduate students will gain a clear vision on the state of the art of the research and real-world practice on system dependability and analytics.

The book is published in honor of Professor Ravishankar K. Iyer, the George and Ann Fisher Distinguished Professor in the Department of Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign (UIUC), Urbana, Illinois. Professor Iyer is ACM Fellow, IEEE Fellow, AAAS Fellow, and served as Interim Vice Chancellor of UIUC for research during 2008-2011. The book contains chapters written by many of his former students.

Autor

Long Wang is Associate Professor of Institute for Network Sciences and Cyberspace at Tsinghua University. Prior to that he was Senior Research Staff Member of IBM T. J. Watson Research Center and was Lead of the Security and Resiliency division of IBM Watson Cloud. He is Senior Member of IEEE.   Karthik Pattabiraman is Professor of Electrical and Computer Engineering at the University of British Columbia (UBC). He is currently Vice Chair of the IFIP Working Group on Dependable Computing and Fault Tolerance (WG 10.4) and is Senior Member of the IEEE and Distinguished member of the ACM.   Catello (Lelio) Di Martino is principal researcher and leader of ecosystems in the Network Systems and Security Research Laboratory of Nokia Bell Labs. His research focuses on highly resilient large-scale communication systems (including 6G) , SLA-driven network automation, chaos engineering, industrial internet of things, and data-intensive systems.   Arjun P. Athreya is Assistant Professor in the Dept. Of Molecular Pharmacology and Experimental Therapeutics, College of Medicine, Mayo Clinic, Rochester, MN, USA.   Saurabh Bagchi is Professor at Purdue University and International Visiting Faculty at the Indian Institute of Technology at Kharagpur. He is the founding Director of the CRISP Research Center at Purdue University and the co-founder of a cloud startup KeyByte. He is an IEEE Computer Society Golden Core Member, Distinguished Contributor, and Distinguished Visitor.

Produktdetails

• Springer Series in Reliability Engineering
• Verlag: Springer / Springer International Publishing / Springer, Berlin
• Artikelnr. des Verlages: 978-3-031-02065-0
• 1st edition 2023
• Seitenzahl: 448
• Erscheinungstermin: 26. Juli 2023
• Englisch
• Abmessung: 235mm x 155mm x 25mm
• Gewicht: 674g
• ISBN-13: 9783031020650
• ISBN-10: 3031020650
• Artikelnr.: 68342466