Study of X-ray Difrectometer (XRD)
Ruchi Chandrakar
Broschiertes Buch

Study of X-ray Difrectometer (XRD)

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Proper sample preparation is crucial in getting highly quality X-ray diffractometer data. If the sample has not been putted within the parameters to properly prepare XRD sample then it introduces errors that make phase identification difficult to impossible and estimates of abundances and crystallinity erroneous. Ideally, we might prefer to lead three conditions so as to own good data: (a) Total randomness of crystallite orientation. (b) Sufficient number of crystallites to induce a representative intensity distribution for the sample. (c) Sufficient diffraction intensity to satisfy counting s...