Study of Recrystallization via Electrical Resistivity Measurements
Sanjay Vajpai
Broschiertes Buch

Study of Recrystallization via Electrical Resistivity Measurements

A novel approach based on isogeometric approximation using splines and robust numerical differentiation

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Recrystallization has been extensively utilized for variety of materials to modify the microstructure and achieving desired mechanical properties. Therefore, characterization of recrystallization is an important aspect. However, most of the existing characterization techniques are either not in-situ in nature or too complex. In the present work, a novel method of spline-based isogeometric approximation and robust numerical differentiation has been originated and employed to the in-situ resistivity data to characterize recrystallization. It has been shown that this method is able to reveal the ...