Study of powder microstructure
The Warren and Averbach method
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Ideally, X-ray diffraction by a crystal produces Dirac peaks at diffraction angles; the graphical representation of diffracted intensity as a function of angle 2 is called a diffraction pattern or diffractogram, or diffraction spectrum.The analysis of diffraction patterns leads to the interpretation of the structures and microstructural properties of crystallized samples. But there are a number of factors influencing peak position, peak width and diffracted intensity, including spectral dispersion, refraction, absorption factor and Lorentz factor.
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