Strategies to Reduce Power during VLSI Circuit Testing

Strategies to Reduce Power during VLSI Circuit Testing

Reduction of Dynamic and Leakage Power during Testing of Digital VLSI Circuits

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Testing is now considered as one of the most important issues in the development process of integrated circuits. With the advent of deep sub-micron (DSM) technology, the tight constraints on power dissipation have created new challenges for testing low power VLSI circuits. This necessitates redesigning the traditional test techniques that do not account for power dissipation during test application. Test power is always expected to be higher than that in the normal mode of operation of a circuit. High test power may lead to permanent or temporal damage of the chip. The objective of this thesis...