"Picking up where the textbooks usually leave off, this book equips readers to deal with non-normal applications scientifically and to explain the methodology to suppliers and customers. It shows how to handle uncooperative real-world processes that do not follow textbook assumptions. The text explains how to set realistic control limits and calculate meaningful process capability indices for non-normal applications. Higlighting the pitfalls of assuming normality for all processes, the book addresses multivariate systems, nested variation sources, as well as lognormal, gamma, and Weibull distributions"--…mehr
"Picking up where the textbooks usually leave off, this book equips readers to deal with non-normal applications scientifically and to explain the methodology to suppliers and customers. It shows how to handle uncooperative real-world processes that do not follow textbook assumptions. The text explains how to set realistic control limits and calculate meaningful process capability indices for non-normal applications. Higlighting the pitfalls of assuming normality for all processes, the book addresses multivariate systems, nested variation sources, as well as lognormal, gamma, and Weibull distributions"--
William A. Levinson is the owner of Levinson Productivity Systems in Wilkes-Barre, Pennsylvania.
Inhaltsangabe
Introduction. What to Expect From This book. Chapter Overview. Traditional Control Charts. Statistical Hypothesis Testing. Control Chart Concepts. Theoretical and Empirical Control Charts. Nonnormal Distributions. Data Fitting and Verification. Control Chart Construction: Center Line, Control Limits, and Zone Tests. Process Capability Indices. Nested Normal Distributions. Calculation of the variance components. Tests for Goodness of Fit. Control Chart. Process capability indices. Confidence Intervals for Process Capability Indices. Confidence Intervals for Cp. Confidence Intervals for CPL and CPU. The Noncentral t Distribution. Confidence Intervals for Cpk. The Bivariate Noncentral t Distribution. Exact Confidence Intervals for the Gamma Distribution Cpk. Multivariate Normal Systems. T' Chart. Calculation of Nonconforming Fraction, and a Capability Index.
Introduction. What to Expect From This book. Chapter Overview. Traditional Control Charts. Statistical Hypothesis Testing. Control Chart Concepts. Theoretical and Empirical Control Charts. Nonnormal Distributions. Data Fitting and Verification. Control Chart Construction: Center Line, Control Limits, and Zone Tests. Process Capability Indices. Nested Normal Distributions. Calculation of the variance components. Tests for Goodness of Fit. Control Chart. Process capability indices. Confidence Intervals for Process Capability Indices. Confidence Intervals for Cp. Confidence Intervals for CPL and CPU. The Noncentral t Distribution. Confidence Intervals for Cpk. The Bivariate Noncentral t Distribution. Exact Confidence Intervals for the Gamma Distribution Cpk. Multivariate Normal Systems. T' Chart. Calculation of Nonconforming Fraction, and a Capability Index.
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