Spectroscopic Ellipsometry for Photovoltaics
Gebundenes Buch

Spectroscopic Ellipsometry for Photovoltaics

Volume 2: Applications and Optical Data of Solar Cell Materials

Herausgegeben: Fujiwara, Hiroyuki; Collins, Robert W.
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Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and ...