Scientific Computing in Electrical Engineering
Proceedings of the SCEE-2002 Conference held in Eindhoven
Herausgegeben: Schilders, Wilhelmus H. A.; ter Maten, E. Jan W.; Houben, Stephan H. M. J.; Maten, E. Jan W. ter
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The fourth international conference on Scientific Computing in Electrical En gineering (SCEE) was held at the Eindhoven University of Technology, from 23rd to 28th June, 2002. It was sponsored by Philips Research Laborato ries Eindhoven, the Eindhoven University of Technology, Computer Simula tion Technology (CST) from Darmstadt, ABB Corporate Research, Thales Netherlands,the European Consortium for Mathematics in Industry (ECMI), the University of Rostock (organiser of SCEE-2000), the European network for Mathematics, Computing and Simulation for Industry (MACSI-net), the Royal Netherlands Ac...
The fourth international conference on Scientific Computing in Electrical En gineering (SCEE) was held at the Eindhoven University of Technology, from 23rd to 28th June, 2002. It was sponsored by Philips Research Laborato ries Eindhoven, the Eindhoven University of Technology, Computer Simula tion Technology (CST) from Darmstadt, ABB Corporate Research, Thales Netherlands,the European Consortium for Mathematics in Industry (ECMI), the University of Rostock (organiser of SCEE-2000), the European network for Mathematics, Computing and Simulation for Industry (MACSI-net), the Royal Netherlands Academy of Arts and Sciences (KNAW), and the Scien tific Computing Group of the Eindhoven University of Technology. The Program Committee consisted of: Dr. Alain Bossavit, Electricite de France, Clamart, France. Dr. Uwe Feldmann, Infineon Technologies A.G., Munich, Germany. Prof.Dr. Leszek Demkowicz, University of Texas at Austin, USA. Dr. Michael Gunther, Universitat Karlsruhe, Germany. Prof.Dr. Ulrich Langer, Johannes Kepler Universitat, Linz, Austria. Dr. Jan ter Maten,Philips Research Laboratories Eindhoven, The Nether lands. Prof.Dr. Ursula van Rienen, Universitat Rostock, Germany. Prof.Dr. Jaijeet Roychowdhury, University of Minnesota, USA. - Prof.Dr. Wil Schilders, Technische Universiteit Eindhoven and Philips Research Laboratories Eindhoven, The Netherlands. - Prof.Dr. Thomas Weiland, Technische Universitat Darmstadt, Germany.
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