Joseph Goldstein, Dale E. Newbury, David C. Joy

Gebundenes Buch

Scanning Electron Microscopy and X-Ray Microanalysis

Third Edition

Mitwirkender: Joy, David C.; Newbury, Dale E.

Beschreibung

In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and "through-the-lens" detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.

Autor

Joseph Goldstein, University of Massachusetts, Amherst, MA, USA / Dale E. Newbury, National Institute of Standards and Technology, Gaithersburg, MD, USA / David C. Joy, University of Tennessee, Knoxville, TN, USA / Charles E. Lyman, Lehigh University, Bethlehem, PA, USA / Patrick Echlin, University of Cambridge, UK / Eric Lifshin, State University at Albany, NY, USA / L.C. Sawyer, Ticona LLC, Summit, NJ, USA / J.R. Michael, Sandia National Laboratories, Albuquerque, NM, USA

Produktdetails

• Verlag: Springer / Springer Netherlands / Springer US
• Artikelnr. des Verlages: 11127857, 978-0-306-47292-3
• 3rd ed.
• Seitenzahl: 689
• Erscheinungstermin: 31. Januar 2003
• Englisch
• Abmessung: 263mm x 187mm x 34mm
• Gewicht: 1619g
• ISBN-13: 9780306472923
• ISBN-10: 0306472929
• Artikelnr.: 14050443

Rezensionen

"There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written [and] well organized[.]... This is a reference text that no SEM or EPMA laboratory should be without." --Thomas J. Wilson, in Scanning, Vol. 27, No. 4, July/August 2005 "As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. The principal application and sample preparation given in this book are suitable for undergraduate students and technicians learning SEEM and EDS/WDS analyses. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists." (Microscopy and Microanalysis, 9:5 (October 2003)

From a review of the first edition:
`The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.'
Microscope Journal