Retroreflex Ellipsometry for Nonplanar Surfaces
Chia-Wei Chen
Broschiertes Buch

Retroreflex Ellipsometry for Nonplanar Surfaces

Versandkostenfrei!
Sofort lieferbar
42,00 €
inkl. MwSt.
PAYBACK Punkte
0 °P sammeln!
Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces.