
Power Distribution Networks in High Speed Integrated Circuits
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Distributing power in high speed, high complexity integrated circuits has become a challenging task as power levels exceeding tens of watts have become commonplace while the power supply is plunging toward one volt. This book is dedicated to this important subject. The primary purpose of this monograph is to provide insight and intuition into the behavior and design of power distribution systems for high speed, high complexity integrated circuits.
Produktbeschreibung
- Verlag: Springer US / Springer, Berlin
- 2004
- Seitenzahl: 308
- Erscheinungstermin: 23. Oktober 2012
- Englisch
- Abmessung: 235mm x 155mm x 17mm
- Gewicht: 470g
- ISBN-13: 9781461350576
- ISBN-10: 1461350573
- Artikelnr.: 39512433
Herstellerkennzeichnung
Springer-Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
ProductSafety@springernature.com
From the reviews:
"This authoritative and interesting book concentrates on explanation of behavior and design of power distribution systems for high-speed and high-complex ICs. ... It is a nice introductory text on basic principles that govern the design and operation of on-chip power distribution networks. This book is timely, and very well written. Its style is clear and readable. It should make an important reference book ... . an excellent work and should be read by many of us. It is ... an instructive and informative well-written book." (Mile Stojcev, Microelectronics Reliability, Vol. 44, 2004)
"This authoritative and interesting book concentrates on explanation of behavior and design of power distribution systems for high-speed and high-complex ICs. ... It is a nice introductory text on basic principles that govern the design and operation of on-chip power distribution networks. This book is timely, and very well written. Its style is clear and readable. It should make an important reference book ... . an excellent work and should be read by many of us. It is ... an instructive and informative well-written book." (Mile Stojcev, Microelectronics Reliability, Vol. 44, 2004)
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