Power- And Thermal-Aware Testing of System-on-Chip
Rajit Karmakar
Broschiertes Buch

Power- And Thermal-Aware Testing of System-on-Chip

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Testing is the most crucial part of VLSI Design cycle, which evaluates the quality and defect-free functionality of an integrated circuit. Exponentially growing design complexity demands for an enormous amount of test data to test an IC for different possible faults. The demand of shorter design turnaround time often encourages the test engineers to test multiple modules concurrently, helping to reduce the overall test time. On the other hand, overlapping testing of multiple modules increases the power consumption and temperature manifold, which in turn, may cause serious damage to the chip du...