Parametric Reliability of Space-Based Field Programmable Gate Arrays
Joseph C. Pomager
Broschiertes Buch

Parametric Reliability of Space-Based Field Programmable Gate Arrays

Versandkostenfrei!
Versandfertig in über 4 Wochen
54,99 €
inkl. MwSt.
PAYBACK Punkte
27 °P sammeln!
The high cost of failure for microelectronic devices operating in the space environment has led to a need for an accurate characterization of a device's reliability prior to being deployed. In addition, significant cost savings can be achieved by determining this reliability prior to fabrication. High performance and flexibility requirements for many space applications have led to an integration of small feature-sized field programmable gate arrays (FPGA) into system designs. Specifically, feature sizes as small as 130, 90, and 65 nm. In this research, a characterization of the space environme...