Optoelectronic and structural properties of a-As/c-Si junction
Jinan Hussein
Broschiertes Buch

Optoelectronic and structural properties of a-As/c-Si junction

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The amorphous Arsenic is one of the major elements which is working as a junction with silicon. Arsenic films with different thicknesses have been deposited by thermal evaporation technique on glass substrates and c-Si wafer at substrate temperature equal to room temperature under vacuum of 10-5 mbar. These films have been annealed at different annealing temperatures. The structural characteristics of the films prepared on glass substrates have been studied by using X-ray diffraction and AFM. These tests show that all the films have amorphous structure for all thicknesses at room temperature. ...