Novel sensors for scanning force microscopy based on carbon nanotube mechanical resonators

Novel sensors for scanning force microscopy based on carbon nanotube mechanical resonators

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Dynamic mode scanning force microscopy is a versatile method for studying forces and force-related properties close to a sample's surface with sub-nanometer resolution. The measurement principle of this method is based on mechanically exciting a force sensor consisting of a cantilever beam with a sharp interaction tip at its free end to oscillations close to or at its resonance frequency. Interactions between the sample and the tip alter the resonance frequency of the cantilever beam and the corresponding changes in its oscillatory state can be used to reconstruct sample properties.In this boo...