Yu Jiang, Junyong Tao, Xun Chen

Gebundenes Buch

Non-Gaussian Random Vibration Fatigue Analysis and Accelerated Test

Beschreibung

This book discusses the theory, method and application of non-Gaussian random vibration fatigue analysis and test. The main contents include statistical analysis method of non-Gaussian random vibration, modeling and simulation of non-Gaussian/non-stationary random vibration, response analysis under non-Gaussian base excitation, non-Gaussian random vibration fatigue life analysis, fatigue reliability evaluation of structural components under Gaussian/non-Gaussian random loadings, non-Gaussian random vibration accelerated test method and application cases. From this book, the readers can not only learn how to reproduce the non-Gaussian vibration environment actually experienced by the product, but also know how to evaluate the fatigue life and reliability of the structure under non-Gaussian random excitation.

Autor

Professor Yu Jiang is currently a professor at the National University of Defense Technology (NUDT), China. He received his Ph.D. in Mechanical Engineering from the NUDT in 2005.He was a visiting scholar at the University of Akron's Intelligent Structural Engineering and Health Monitoring Lab (ISEHML) and at the University of Maryland's Dynamic Systems and Vibrations Laboratory (DSVL), USA. He is the vice chairman of the Reliability Branch of the Chinese Institute of Electronics. His research interests include reliability engineering, structural health monitoring, accelerated testing, vibration fatigue, and structural dynamics. He has published 2 books and more than 30 technical papers in international journals and conferences,such as Mechanical Systems and Signal Processing(MSSP) and Microelectronics Reliability(MR), etc. He has been a PI and co-PI of various research projects funded by the National Natural Science Foundation of China, Chinese government and industries, etc. Professor Junyong Tao is presently a professor at the National University of Defense Technology, China, and a chairman of the Key Laboratory of Science and Technology on Integrated Logistics Support. He was a visiting professor at the Center for Reliability and Risk, University of Maryland, College Park, USA. He is a fellow of the Chinese Failure Analysis Institution of the CMES and National Standardization Technical Committees (SAC/TC122/SC2). His research interests include reliability testing, system reliability, MEMS reliability, and resilience of systems of systems. He has published more than 90 technical papers in journals and international conference proceedings in the areas of mechanical engineering and system simulation. Professor Xun Chen is presently a professor at the National University of Defense Technology, China, and a vice chairman of the Reliability Branch of the Chinese Mechanical Engineering

Produktdetails

• Verlag: National Defense Industry Press / Springer / Springer Nature Singapore / Springer, Berlin
• Artikelnr. des Verlages: 978-981-16-3693-6
• 1st edition 2022
• Seitenzahl: 176
• Erscheinungstermin: 16. September 2021
• Englisch
• Abmessung: 241mm x 160mm x 16mm
• Gewicht: 436g
• ISBN-13: 9789811636936
• ISBN-10: 9811636931
• Artikelnr.: 61984841