Gebundenes Buch

Nanocharacterisation

Beschreibung

Following on from the success of the first edition, this new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods used to study nanostructured materials. With contributions from internationally recognised experts, each chapter focuses on a different technique to characterise nanomaterials providing experimental procedures and applications. This indispensable resource will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology.

Autor

A I Kirkland is Professor of Materials at Oxford University and the author of over 170 refereed papers. He was awarded "best materials paper" of 2005 by the Microscopy Society of America. Since 2000 he has also been involved in the characterisation of CCD cameras for TEM. His most recent work involves the development of approaches to complex phase extension and diffractive imaging to further improve resolution.

Produktdetails

• Verlag: RSC Publishing
• 2nd edition
• Seitenzahl: 358
• Erscheinungstermin: 24. August 2015
• Englisch
• Abmessung: 236mm x 160mm x 28mm
• Gewicht: 680g
• ISBN-13: 9781849738057
• ISBN-10: 184973805X
• Artikelnr.: 42053964