Shengkai Wang, Xiaolei Wang

Broschiertes Buch

MOS Interface Physics, Process and Characterization

Beschreibung

The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.

Autor

Shengkai Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the University of Tokyo in 2011 and has been engaged in Ge, III-V, SiC in MOS technology. He has published more than 100 papers and authorized 40+ patents. Xiaolei Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the Institute of Microelectronics, Chinese Academy of Sciences in 2013 and has been engaged in Si/Ge based MOS technology. He has published more than 100 papers.

Produktdetails

• Verlag: CRC Press
• Seitenzahl: 174
• Erscheinungstermin: 29. Januar 2024
• Englisch
• Abmessung: 229mm x 152mm x 10mm
• Gewicht: 262g
• ISBN-13: 9781032106281
• ISBN-10: 103210628X
• Artikelnr.: 69923369