Modeling and Simulation of Negative Bias Temperature Instability
Robert Entner
Broschiertes Buch

Modeling and Simulation of Negative Bias Temperature Instability

Degradation of Field-Effect Transistors

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Revision with unchanged content. Semiconductor process and device simulators are well established tools for the reduction of the development time for semiconductor devices. Nowadays simulation efforts go beyond solving the basic semiconductor device equations. Especially the modeling and simulation of aging processes has tremendously gained in importance. This book gives insight into the topic of semiconductor device simulation and focuses on the modeling of degradation mechanisms. Negative bias temperature instability (NBTI) causes degradation of MOS structures at elevated temperatures and ne...