Andere Kunden interessierten sich auch für
![Materials, Processes and Reliability for Advanced Interconnects for Micro- And Nanoelectronics 2009]( "Materials, Processes and Reliability for Advanced Interconnects for Micro- And Nanoelectronics 2009")
Materials, Processes and Reliability for Advanced Interconnects for Micro- And Nanoelectronics 200936,99 €![Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- And Nanoelectronics]( "Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- And Nanoelectronics")
Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- And Nanoelectronics37,99 €![Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics 2004]( "Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics 2004")
Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics 200437,99 €![Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics]( "Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics")
Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics38,99 €![CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications]( "CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications")
CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications106,99 €![CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications]( "CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications")
CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications34,99 €![Nuclear Radiation Detection Materials 2009]( "Nuclear Radiation Detection Materials 2009")
Nuclear Radiation Detection Materials 2009119,99 €
