Low Temperature Atomic Force / Magnetic Force Microscopy
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Low Temperature Atomic Force / Magnetic Force Microscopy

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The invention of Scanning Tunneling Microscope (STM) in 1981 opened a new avenue in atomic scale world and surface science. STM made it possible to either image atoms or manipulate them as well as measuring the local density of states of electrons on the surface. This invention also leaded invention of Atomic Force Microscopy (AFM) soon which measures the interaction forces between a sharp tip attached at the end of a lever and sample surfaces at atomic length scales. AFM could measure various forces between tip-sample like van der Waals, electrostatic, friction or magnetic forces. Implementat...