Lifetime aware device design using failure mechanism analysis
Versandkostenfrei!
Versandfertig in 1-2 Wochen
43,99 €
inkl. MwSt.
PAYBACK Punkte
22 °P sammeln!
As the device scales down, several serious design challenges emerges namely design complexity, power, crosstalk, delay and reliability. The design challenges are interrelated and a tradeoff has to be done for yielding a reliable structure for portable microelectronic devices in the DSM era.. By considering this, the book focuses on developing a reliability prediction system using failure mechanism analysis.The work suggests the ways to handle failure mechanisms to maintain the reliability of power semiconductor device. Hence, the need for a lifetime aware device design has been emphasized in t...
As the device scales down, several serious design challenges emerges namely design complexity, power, crosstalk, delay and reliability. The design challenges are interrelated and a tradeoff has to be done for yielding a reliable structure for portable microelectronic devices in the DSM era.. By considering this, the book focuses on developing a reliability prediction system using failure mechanism analysis.The work suggests the ways to handle failure mechanisms to maintain the reliability of power semiconductor device. Hence, the need for a lifetime aware device design has been emphasized in this book.
Andere Kunden interessierten sich für
