Gebundenes Buch

Kelvin Probe Force Microscopy

Measuring and Compensating Electrostatic Forces

Herausgegeben: Sadewasser, Sascha; Glatzel, Thilo
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This volume presents a concise introduction to Kelvin probe force microscopy. The text discusses potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.