Jon Duncan Hagar

Broschiertes Buch

IoT System Testing

An IoT Journey from Devices to Analytics and the Edge

Beschreibung

To succeed, teams must assure the quality of IoT systems. The world of technology continually moves from one hot area to another; this book considers the next explosion-of IoT-from a quality testing viewpoint. You'll first gain an introduction to the Internet of Things (IoT), V&V, and testing. Next, you'll be walked through IoT test planning and strategy over the full life cycle, including the impact of data analytics and AI. You will then delve deeper into IoT security testing and various test techniques, patterns, and more. This is followed by a detailed study of IoT software test labs, architecture, environments and AI. There are many options for testing IoT qualities based on the criticality of the software and risks involved; each option has positives, negatives, as well as cost and schedule impacts. The book will guide start-up and experienced teams into these paths and help you to improve the testing and quality assessment ofIoT systems. What You Will LearnUnderstand IoT software test architecture and planningMaster IoT security testing and test techniquesStudy IoT test lab automation and architecturesReview the need for IoT security, data analytics, AI, Neural Networks and dependability using testing and V&V Who This Book Is ForReaders with basic knowledge of software development who want to learn more about IoT testing and its intricacies, as well as companies moving into the domain of IoT, and even those already deep into the IoT domain will benefit from this book.

Autor

Jon Hagar is a senior tester with 40 years' experience in software development and testing.  He has supported software product design, integrity, integration, reliability, measurement, verification, validation, and testing on various projects and software domains (environments).  He has an M.S. degree in Computer Science with specialization in Software Engineering and Testing from Colorado State University and a B.S. Degree in Math with specialization in Civil Engineering and Software from Metropolitan State College of Denver, Colorado.  Jon has worked in business analysis, systems, and software engineering, specializing in testing, verification and validation. Projects he has supported include the domains of embedded, mobile devices, IoT, PC/IT systems, and test lab and tool development. Currently, Jon works as a consultant for Grand Software Testing, LLC. Jon has taught hundreds of classes and tutorials in software engineering, systems engineering, and testing throughout the industry and universities.  He has published numerous articles on software reliability, testing, test tools, formal methods, mobile, and embedded systems.  He is the author of the book Software Test Attacks to Break Mobile and Embedded Devices and contributor to books on Agile testing and test automation.  Jon makes presentations regularly at industry working groups and conferences. Jon most recently has been working on: combinatorial testing, test automation, handheld-mobile devices, IoT security testing, and error taxonomies for IoT/embedded systems.

Produktdetails

• Verlag: Apress / Springer, Berlin
• Artikelnr. des Verlages: 978-1-4842-8275-5
• 1st ed.
• Seitenzahl: 348
• Erscheinungstermin: 17. September 2022
• Englisch
• Abmessung: 254mm x 178mm x 19mm
• Gewicht: 655g
• ISBN-13: 9781484282755
• ISBN-10: 1484282752
• Artikelnr.: 63745958