Handbook of Optical Metrology
Principles and Applications, Second Edition
Herausgegeben: Yoshizawa, Toru
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Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text:Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elementsAddresses interferometry, holography, and speckle methods and applicationsExplains Moiré metrology and the optical heterodyne measurement methodDelve...
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text:
Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elementsAddresses interferometry, holography, and speckle methods and applicationsExplains Moiré metrology and the optical heterodyne measurement methodDelves into the specifics of diffraction, scattering, polarization, and near-field opticsConsiders applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes
This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters-nearly 100 pages-on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elementsAddresses interferometry, holography, and speckle methods and applicationsExplains Moiré metrology and the optical heterodyne measurement methodDelves into the specifics of diffraction, scattering, polarization, and near-field opticsConsiders applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes
This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters-nearly 100 pages-on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
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