Sunil S. Patil, Prashant P. Patil, Vaibhav A. Lodam

Broschiertes Buch

Genetic Analysis in Soybean

Study of Genetic Variability, Correlation Coefficient, Path Analysis and Genetic Divergence in Soybean

Beschreibung

A field experiment was carried out at Navsari Agriculture University, Gujarat (India) for the estimation of Genetic Variability, Heritability, Genetic Advance, Correlation, Path Analysis and Genetic Divergence in 36 soybean genotypes obtained from different eco-geographical regions of India. The highest genotypic and phenotypic coefficient of variances were observed for plant height followed by seed yield per plant and pods per plant and it was lowest for days to 50% flowering, days to maturity, protein content and pod length. High heritability and genetic advance were observed for plant height, seed yield per plant and pods per plant. Seed yield per plant was positively and significantly correlated with plant height, pods per plant, days to 50 per cent flowering and days to maturity. Pod per plant recorded highest positive direct effect on seed yield per plant followed plant height. However, there was a substantial genetic diversity between the genotypes with D2 values ranging from 33.64 to 379.08. Thirty six genotypes were grouped into six clusters. The clustering pattern revealed that genetic diversity was not necessarily associated with geographical diversity in this crop.

Autor

Sunil S. Patil completed his Post Graduation in Genetics and Plant Breeding from N.A.U.,Navsari and presently doing Ph. D. in Genetic and Plant Breeding from Navsari Agricultural University, Navsari, Gujarat (India). Sunil have an experience of working in different research schemes of univ. as a ¿Senior Research Fellow'.

Produktdetails

• Verlag: LAP Lambert Academic Publishing
• Seitenzahl: 112
• Erscheinungstermin: 10. Mai 2012
• Englisch
• Abmessung: 220mm x 150mm x 7mm
• Gewicht: 185g
• ISBN-13: 9783847340652
• ISBN-10: 3847340654
• Artikelnr.: 36028421