Electron and Ion Microscopy and Microanalysis

Principles and Applications, Second Edition,
Herausgeber: Murr, Lawrence E

• Broschiertes Buch

Produktbeschreibung

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Produktdetails

• Verlag: CRC Press
• 2nd edition
• Seitenzahl: 856
• Erscheinungstermin: 29. Oktober 2019
• Englisch
• Abmessung: 251mm x 175mm x 48mm
• Gewicht: 1451g
• ISBN-13: 9780367402945
• ISBN-10: 0367402947
• Artikelnr.: 58058207

Autorenporträt

Lawrence E. Murr

Inhaltsangabe

CHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2:
ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3:
ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION
PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES.
CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON
MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.