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Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs
Robert Anholt
Gebundenes Buch

Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs

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Learn why III-V transistor device electrical characteristics change with temperature, and develop models of the temperature change for use in integrated circuit design programs. You'll find never-before presented experimental S-equivalent-circuit parameter data on a wide variety of devices, and learn how to measure S-parameters and fit equivalent circuits.