Anand Asundi

Gebundenes Buch

Digital Holography for MEMS and Microsystem Metrology

Beschreibung

Approaching the topic of digital holography from the practicalperspective of industrial inspection, Digital Holography forMEMS and Microsystem Metrology describes the process ofdigital holography and its growing applications for MEMScharacterization, residual stress measurement, design andevaluation, and device testing and inspection. Asundi also providesa thorough theoretical grounding that enables the reader tounderstand basic concepts and thus identify areas where thistechnique can be adopted. This combination of both practical andtheoretical approach will ensure the book s relevance and appeal toboth researchers and engineers keen to evaluate the potential ofdigital holography for integration into their existing machines andprocesses.

Addresses particle characterization where digital holographyhas proven capability for dynamic measurement of particles in 3Dfor sizing and shape characterization, with applications inmicrofluidics as well as crystallization and aerosol detectionstudies.
Discusses digital reflection holography, digital transmissionholography, digital in-line holography, and digital holographictomography and applications.
Covers other applications including micro-optical anddiffractive optical systems and the testing of these components,and bio-imaging.

Autor

Anand Asundi, Nanyang Technological University, Singapore Anand Asundi is Professor and Deputy Director of the Advanced Materials Research Centre at Nanyang Technological University in Singapore. His research interests are in photomechanics and optical sensors & he has published over 200 papers in peer-reviewed journals and presented invited and plenary talks at international conferences. He has also chaired and organized numerous conferences in Singapore and other parts of the world. He is Editor of Optics and Lasers in Engineering and on the Board of Directors of SPIE, and a fellow of the Institute of Engineers, Singapore and SPIE. He also holds advisory professorial appointments at Tongji University, Shanghai University and Harbin Institute of Technology, China. He is Chairman of the Asian Committee on Experimental Mechanics and the Asia Pacific Committee on Smart and Nano Materials both of which he co-founded.

Produktdetails

• Microsystem and Nanotechnology Series
• Verlag: Wiley & Sons
• Artikelnr. des Verlages: 14597869000
• 1. Auflage
• Seitenzahl: 232
• Erscheinungstermin: 15. August 2011
• Englisch
• Abmessung: 242mm x 167mm x 19mm
• Gewicht: 495g
• ISBN-13: 9780470978696
• ISBN-10: 0470978694
• Artikelnr.: 33256386