DFT+DFD: An Integrated Method for Design for Testability and Diagnosis

DFT+DFD: An Integrated Method for Design for Testability and Diagnosis

Enhancing Fault Coverage and Diagnostic Resolution Synergistically

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While conventional test point insertions commonly used in design for testability can improve fault coverage, the test points selected may not necessarily be the best candidates to aid silicon diagnosis. This book targets test point insertions to detect more faults as well as to distinguish currently indistinguishable fault-pairs. This is achieved by identifying those points in the circuit, which are not only hard-to-test but also lie on distinguishable frontiers, as Testability-Diagnosability (TD) points. To this end, a novel low-cost metric to identify such TD points is proposed. Further, a n...