Smita Krishnaswamy, Igor L. Markov, John P. Hayes

Broschiertes Buch

Design, Analysis and Test of Logic Circuits Under Uncertainty

Beschreibung

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Produktdetails

• Lecture Notes in Electrical Engineering 115
• Verlag: Springer / Springer Netherlands
• Artikelnr. des Verlages: 978-94-007-9798-7
• 2013
• Seitenzahl: 136
• Erscheinungstermin: 15. Oktober 2014
• Englisch
• Abmessung: 235mm x 155mm x 8mm
• Gewicht: 219g
• ISBN-13: 9789400797987
• ISBN-10: 9400797982
• Artikelnr.: 41649005