CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications
Broschiertes Buch

CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications

Volume 1155

Herausgeber: Demkov, Alexander A.; Harris, H. Rusty; Taylor, Bill
Versandkostenfrei!
Versandfertig in 1-2 Wochen
34,99 €
inkl. MwSt.
PAYBACK Punkte
17 °P sammeln!
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.