Broschiertes Buch

Bias Temperature Instability for Devices and Circuits

Beschreibung

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

Produktdetails

• Verlag: Springer / Springer New York / Springer, Berlin
• Artikelnr. des Verlages: 978-1-4939-5529-9
• Softcover reprint of the original 1st ed. 2014
• Seitenzahl: 824
• Erscheinungstermin: 1. Oktober 2016
• Englisch
• Abmessung: 235mm x 155mm x 41mm
• Gewicht: 1374g
• ISBN-13: 9781493955299
• ISBN-10: 1493955292
• Artikelnr.: 45509696