Applied Scanning Probe Methods IV
Broschiertes Buch

Applied Scanning Probe Methods IV

Industrial Applications

Herausgegeben: Bhushan, Bharat; Fuchs, Harald
Versandkostenfrei!
Versandfertig in 6-10 Tagen
112,99 €
inkl. MwSt.
Weitere Ausgaben:
PAYBACK Punkte
56 °P sammeln!
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rstthere were two the ScanningTunnelingMicroscope,or STM,andtheAtomicForceMic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when itwasplacednearthesample.These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM.TheMFMwillimageasinglemagneticbitwithfeaturesa...