Anomalous X-Ray Scattering for Materials Characterization
Yoshio Waseda
Broschiertes Buch

Anomalous X-Ray Scattering for Materials Characterization

Atomic-Scale Structure Determination

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The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interr...