Advances in X-Ray Analysis
Broschiertes Buch

Advances in X-Ray Analysis

Volume 17: Proceedings of the Twenty-Second Annual Conference on Applications of X-Ray Analysis held in Denver, August 22-24, 1973

Herausgegeben: Grant, C.
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The successful application of x-r~ diffraction techniques and x-r~ spectrometry depends in large measure on the availability of dependable standards and reference data. The preparation of such standards in the fields of metallurgy, geology, life sciences, and other disciplines is both costly and time consuming. As a result. the necessary standards for effective utilization of existing instrumentation are often not available. One of the purposes of the invited papers in this 22nd Annual Denver X-Ray Conference was tc review the status of programs to prepare such standards and reference data. Si...