Advances in X-Ray Analysis
Broschiertes Buch

Advances in X-Ray Analysis

Volume 33

Herausgegeben von Barrett, Charles S.; Gilfrich, John V.; Huang, Ting C.; Jenkins, Ron
Versandkostenfrei!
Versandfertig in 6-10 Tagen
39,99 €
inkl. MwSt.
PAYBACK Punkte
20 °P sammeln!
The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates emphasis between x-ray diffraction and x-ray fluorescence, and this being an odd year the emphasis was on diffraction. Thus the Plenary Session was slanted toward diffraction in general and thin film analysis in particular. The Plenary Session on x-ray analysis of thin films did not just happen this year but really began four years ago with Paul Predecki suggesting a special session devoted to thin film techn...