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Advances in Imaging and Electron Physics
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Main description:Advances in Imaging and Electron Physics is the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computingmethods used in all these domains.Review quote:"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Adv...
Main description:
Advances in Imaging and Electron Physics is the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computingmethods used in all these domains.
Review quote:
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics and Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
--MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical and Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE
Table of contents:
L. Lambert and T. Mulvey, Ernst Ruska (1906-1988), Designer Extraordinaire of the Electron Microscope: A Memoir. V.T. Binh, N. Garcia, and S.T. Purcell, Electron Field Emission from Atom-Sources: Fabrication, Properties, and Applications of Nanotips. P.L. Combettes, The Convex Feasibility Problem in Image Recovery. C. Doran, A. Lasenby, S. Gull, S. Somaroo, and A. Challinor, Spacetime Algebra and Electron Physics. H.C. Shen and D. Srivastava,Texture Representation and Classification: The Feature Frequency Matrix Approach. Chapter References. Subject Index.
Advances in Imaging and Electron Physics is the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computingmethods used in all these domains.
Review quote:
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics and Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
--MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical and Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE
Table of contents:
L. Lambert and T. Mulvey, Ernst Ruska (1906-1988), Designer Extraordinaire of the Electron Microscope: A Memoir. V.T. Binh, N. Garcia, and S.T. Purcell, Electron Field Emission from Atom-Sources: Fabrication, Properties, and Applications of Nanotips. P.L. Combettes, The Convex Feasibility Problem in Image Recovery. C. Doran, A. Lasenby, S. Gull, S. Somaroo, and A. Challinor, Spacetime Algebra and Electron Physics. H.C. Shen and D. Srivastava,Texture Representation and Classification: The Feature Frequency Matrix Approach. Chapter References. Subject Index.