Gebundenes Buch

Advances in Imaging and Electron Physics

Volume 175

Herausgegeben: Hawkes, Peter W.

Beschreibung

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Autor

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Produktdetails

• Advances in Imaging and Electron Physics Volume 175
• Verlag: Academic Press / Elsevier Science & Technology
• Artikelnr. des Verlages: C2011-0-06740-6
• Seitenzahl: 360
• Erscheinungstermin: 7. Februar 2013
• Englisch
• Abmessung: 20mm x 152mm x 229mm
• Gewicht: 683g
• ISBN-13: 9780124076709
• ISBN-10: 012407670X
• Artikelnr.: 36966524