1/f Noise Measurement System & Studies on Thin Films of CdO and Ag

1/f Noise Measurement System & Studies on Thin Films of CdO and Ag

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1/f noise plays an important role in choosing frequency band in which a device can be effectively used. As 1/f noise is from the fluctuations of microscopic entities, it can act as a probe of what is happening physically at the microscopic scale. This noise limits the sensitivity and stability of many radio electronic devices, the requirements to which are enhancing constantly. 1/f noise a valuable informative parameter for evaluating the quality of materials and reliability of devices containing thin films and integrated micro chips. The existing method of 1/f noise measurement is a cumbersom...